Chapter 7 Test Menu TSU LT User Manual
52 © 2003 ADTRAN, Inc. 61203060L1-1A
The self-test includes the following board-level tests, in this order:
1. RAM tests; EPROM checksum
2. On-board data path; sending a known test pattern through an on-board loop
3. Front panel LED verification
4. Phase lock loop verification. If a failure is detected, note the failure number and contact ADTRAN
Technical Support.
PORT TESTS
These two tests (DTE L
OOPBCK
and D
ATA
L
OOPBCK
) control the activation of a DTE loopback and a data
loopback (see Figure 7-4). The
DTE L
OOPBK
loops data received at the V.35 interface back towards the
DTE. The
D
ATA
L
OOPBACK
test the data is looped back just before going out the V.35 interface.
Figure 7-4. Port Loopback Tests
Executing self-test disrupts normal data flow and prevents remote communication until the
self-test is completed (approximately five seconds).
(NI)
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